MIT Researchers Use X-Rays to Map Microscopic Heat Barriers in Multilayered Chips

TechXplore Engineering reports that MIT researchers have developed a technique to visualize thermal movement through complex electronic architectures. By pairing ultrafast X-ray beams with laser pulses, the team can now penetrate through several layers of material to identify exa

TechXplore Engineering reports that MIT researchers have developed a technique to visualize thermal movement through complex electronic architectures. By pairing ultrafast X-ray beams with laser pulses, the team can now penetrate through several layers of material to identify exa